[RECORDED WEBINAR] Those who missed the DLSU CIF-FSH Webinar Series Lecture #2, “Fundamentals of Scanning Electron Microscopy”, may watch the recorded session and request for an e-certificate of participation. This webinar features Dr. Jose Esmeria Jr., Equipment Specialist - Integrated Electron Microscopy Laboratory, De La Salle University.
To request your e-certificate of attendance, please fill out the evaluation on this link:
https://forms.gle/wXmt53tjTAixcTAw7
Those who will watch the recorded training course may also request for a certificate of participation.
Please ensure proper spelling. The e-certificates are autogenerated. Please allow us to generate the e-certificate over 7 days before sending follow-up emails.
